Title :
High filler loading technique and its effects on the reliability of epoxy molding compound
Author :
Moon, Kyoung Sik ; Hwang, Sung Deck ; Yoon, Ho Gyu ; Ryu, Je Hong ; Woo, Sang Sun
Author_Institution :
Dept. of Mater. Sci., Korea Univ., Seoul, South Korea
Abstract :
A high filler loading technique was evaluated using the simplified packing model proposed by Ouchiyama and Tanaka (Ind. Eng. Chem. Fundam., vol. 23, p. 490, 1984; ibid., vol. 25, p. 125, 1986) and its effect on the reliability of epoxy molding compound (EMC) was investigated. Maximum packing fraction, φm, with the mixing ratio for ternary spherical filler systems was calculated, and it was found that the effect of macropores, which could exist in systems with more than 3 components of different filler size, should be considered in the calculation of φm in a given filler system. Based on the calculations, very low minimum melt viscosity of about 200 poise could be obtained in EMC filled with 85 vol.% of silica. As the amount of filler in EMC was increased, several properties such as coefficient of thermal expansion, moisture absorption and strength were improved. However, the adhesive strength to an alloy 42 leadframe decreased with increasing filler content. Adhesive strength was more rapidly decreased with moisture absorption. From analysis of the interface between EMC and leadframe with X-ray photoelectron spectroscopy, the principal adhesive mechanism was thought to be the hydrogen bond and thus the decrease in adhesion was attributed to hydrogen bond failure due to absorbed water. The higher adhesive strength of low level silica-filled EMC could be explained by the low viscosity and the short intermolecular spacing with the leadframe
Keywords :
X-ray photoelectron spectra; adhesion; encapsulation; filled polymers; hydrogen bonds; integrated circuit packaging; interface structure; mechanical strength; moulding; silicon compounds; thermal expansion; viscosity; EMC strength; EMC-leadframe interface; FeNi; SiO2; X-ray photoelectron spectroscopy; absorbed water; adhesion; adhesive strength; alloy 42 leadframe; coefficient of thermal expansion; epoxy molding compound; filler content; filler loading effects; filler loading technique; filler size; filler system; hydrogen bond; hydrogen bond failure; intermolecular spacing; low level silica-filled EMC; low minimum melt viscosity; macropores; maximum packing fraction; mixing ratio; moisture absorption; packing model; principal adhesive mechanism; reliability; silica filler; ternary spherical filler systems; viscosity; Adhesive strength; Bonding; Electromagnetic compatibility; Electromagnetic wave absorption; Hydrogen; Lead; Moisture; Silicon compounds; Thermal expansion; Viscosity;
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
DOI :
10.1109/EPTC.1998.756023