Title :
The impact of die attach material on type II popcorn cracking
Author :
Chan, K.C. ; Chai, T.C. ; Wong, E.H. ; Lim, T.B.
Author_Institution :
Inst. of Microelectron., Singapore
Abstract :
Recent advances in packaging design, processes and materials have been effective in eliminating or reducing the occurrence of type I and II popcorn failures. However, type II popcorn failures remain prevalent. This paper features a vigorous investigation on the properties of various die attach materials and attempts to correlate the measured properties to the type II popcorn failure rate using a TQFP-208 package. Of the properties evaluated, a high adhesion strength under “hot-wet” conditions consistently exhibited superior popcorn performance. The test measures the adhesion strength between the die and the die-pad at an elevated temperature, after samples have been moisture pre-conditioned. Additionally, the impact of the die attach material properties on package stress and moisture distribution was investigated using finite element analysis. It was found that die attach materials with a high modulus at temperatures above their glass transition temperatures experience less strain due to thermal loading. Moisture diffusion modelling showed that a high moisture absorption die attach material having a high “hot-wet” adhesion can still perform satisfactorily in the popcorn test
Keywords :
adhesion; elastic moduli; finite element analysis; glass transition; integrated circuit modelling; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; microassembling; moisture; plastic packaging; surface mount technology; thermal stress cracking; TQFP-208 package; adhesion strength; die attach material; die attach material modulus; die attach material properties; die attach materials; die/die-pad adhesion strength; finite element analysis; glass transition temperature; hot-wet adhesion; hot-wet conditions; moisture diffusion modelling; moisture pre-conditioned samples; package moisture distribution; package stress; packaging design; packaging materials; packaging processes; popcorn performance; popcorn test; thermal loading; type I popcorn failure; type II popcorn cracking; type II popcorn failure; type II popcorn failure rate; Adhesives; Finite element methods; Material properties; Microassembly; Moisture measurement; Packaging; Process design; Temperature; Testing; Thermal stresses;
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
DOI :
10.1109/EPTC.1998.756025