DocumentCode :
2688806
Title :
Investigation of the adhesion strength between molding compound and leadframe at higher temperatures
Author :
Schmidt, R. ; Alpern, Peter ; Plecher, K. ; Tilgner, R.
Author_Institution :
Semicond. Group, Siemens AG, Munich, Germany
fYear :
1998
fDate :
8-10 Dec 1998
Firstpage :
349
Lastpage :
353
Abstract :
The popcorn effect is still a main failure source where the reliability of surface mounted devices is concerned. For thin packages such as P-TSOPs or P-TQFPs, it was found that after preconditioning to level 3 or level 1, the popcorn effect starts from the back side or the top side of the die pad, respectively. Adhesion tests at room temperature could not enlighten this difference, but raised even more questions. To clarify the situation, we investigated the adhesion strength between molding compound and leadframe and between Ag coating and chip adhesive as a function of temperature, Ag coating and moisture content. We also report on investigations of the temperature dependence of different molding compounds and leadframes, with particular emphasis on leadframes with a special coating which showed increased adhesion strength in comparison to uncoated leadframes in popcorn experiments and adhesion tests at room temperature
Keywords :
adhesion; adhesives; circuit reliability; encapsulation; metallisation; microassembling; moisture; moulding; surface mount technology; thermal stress cracking; 20 C; Ag; Ag coating; JEDEC preconditioning; P-TQFPs; P-TSOPs; adhesion strength; adhesion tests; chip adhesive; die pad; failure source; leadframe; moisture content; molding compound; molding compounds; popcorn effect; reliability; surface mounted devices; temperature dependence; thin packages; uncoated leadframes; Adhesives; Coatings; Lead compounds; Microassembly; Moisture; Packaging; Qualifications; Soldering; Temperature dependence; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 1998. Proceedings of 2nd
Print_ISBN :
0-7803-5141-X
Type :
conf
DOI :
10.1109/EPTC.1998.756028
Filename :
756028
Link To Document :
بازگشت