Title :
A reconfigurable digital signal processing system for eddy currents non-destructive testing
Author :
Rosado, Luis S. ; Ramos, Pedro M. ; Piedade, M. ; Santos, Telmo G. ; Vilaca, P.
Author_Institution :
Inst. de Telecomun., Univ. Tec. de Lisboa, Lisbon, Portugal
Abstract :
This paper presents a digital signal processing system specially designed for eddy currents non-destructive testing. This new system has a field programmable gate array based processing core, communication interfaces, data conversion and analog devices to interface the probes. Communication with personal computers is ensured by Ethernet 10/100 and universal serial bus 2.0 high speed interfaces. The proposed architecture enables to set several combinations of peripherals cards to generate or acquire probe signals. Also, the new system allows the digital generation and analysis of the probe signals through multiple digital signal processing algorithms. Two different peripheral cards have been developed to meet the needs for the new IOnic concept of eddy currents probe. The IOnic acquisition card is composed by a programmable gain amplifier and a high speed analog to digital converter. The current stimulus generation is achieved with a digital to analog converter and a high output current transconductance amplifier. Together, the two peripherals are able to operate the probe from 10 kHz up to 10 MHz. An additional peripheral card to interface stepper motors was designed for sensor positioning.
Keywords :
eddy current testing; field programmable gate arrays; signal processing; analog devices; communication interfaces; data conversion; eddy currents nondestructive testing; field programmable gate array; high speed analog to digital converter; programmable gain amplifier; reconfigurable digital signal processing system; Digital signal processing; Eddy current testing; Eddy currents; Field programmable analog arrays; Nondestructive testing; Probes; Process design; Signal design; Signal generators; System testing; Digital Signal Processing; Eddy Currents; FPGA; Non-Destructive Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5488183