• DocumentCode
    2688988
  • Title

    Lithium niobate SAW device hetero-transferred onto silicon integrated circuit using elastic and sticky bumps

  • Author

    Tanaka, Shoji ; Yoshida, Manabu ; Hirano, Harutoyo ; Esashi, Masayoshi

  • Author_Institution
    Dept. of Nanomech., Tohoku Univ., Sendai, Japan
  • fYear
    2012
  • fDate
    7-10 Oct. 2012
  • Firstpage
    295
  • Lastpage
    298
  • Abstract
    In this study, a new process to temporarily integrate two components via an elastic and sticky silicone layer was developed. The developed integration process is as easy as contact photolithography and even reworkable, and thus will be useful for the quick test of hetro-integrated devices made of different materials of wafer. It was applied to integrated SAW oscillators with resonance frequencies of 400-600 MHz. LiNbO3-based SAW resonators supported by a glass wafer were transferred onto an IC wafer with CMOS sustaining amplifiers. A transfer yield of 96% was obtained, while electrical interconnection was failed for two thirds of samples optimized process conditions to be optimized. The measured phase noise was comparable with that of the SAW oscillator integrated by Au-to-Au bonding.
  • Keywords
    CMOS integrated circuits; integrated circuit interconnections; phase noise; photolithography; silicones; surface acoustic wave oscillators; surface acoustic wave resonators; Au-to-Au bonding; CMOS sustaining amplifiers; LiNbO3 based SAW resonators; LiNbO3; elastic sticky bumps; electrical interconnection; frequency 400 MHz to 600 MHz; glass wafer; hetrointegrated devices; integrated SAW oscillators; phase noise; sticky silicone layer; Bonding; Gold; Integrated circuits; Lithium niobate; Oscillators; Polymers; Surface acoustic waves; Integration; Lithium niobate; Phase noise; SAW oscilaltor; Silicone;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2012 IEEE International
  • Conference_Location
    Dresden
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-4561-3
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2012.0072
  • Filename
    6562080