DocumentCode :
2689004
Title :
Induction defectoscope based on uniform eddy current probe with GMRs
Author :
Postolache, Octavian ; Ribeiro, Artur Lopes ; Ramos, Helena Geirinhas
Author_Institution :
Inst. de Telecomun./IST, Lisbon, Portugal
fYear :
2010
fDate :
3-6 May 2010
Firstpage :
1278
Lastpage :
1283
Abstract :
Defect detection in conductive plates represents an important issue. The present work proposes an induction defectoscope that includes a uniform eddy current probe with a rectangular excitation coil and a set of giant magnetoresistance sensors (GMR). The excitation current, the acquisition of the voltages delivered by the GMR and the signal processing of the acquired signal are performed by a real-time control and processing unit based on a TMS320C6713 digital signal processor (DSP). Different tests were carried out regarding the excitation coil position versus crack orientation and also regarding the GMR position inside the coil and the best response concerning the crack detection for a given aluminum plate specimen. Embedded software was developed using a NI LabVIEW DSP module including sinusoidal signal generation, amplitude and phase extraction using a sine-fitting algorithm and GUI for the induction defectoscope. Experimental results with probe characterization and detection of defects were included in the paper.
Keywords :
computerised instrumentation; curve fitting; digital signal processing chips; eddy current testing; embedded systems; flaw detection; giant magnetoresistance; graphical user interfaces; magnetic sensors; signal generators; signal processing equipment; GMR; GUI; LabVIEW DSP module; TMS320C6713 digital signal processor; amplitude extraction; conductive plate; embedded software; giant magnetoresistance sensor; induction defectoscope; phase extraction; processing unit; real time control unit; rectangular excitation coil; signal processing; sine fitting algorithm; sinusoidal signal generation; uniform eddy current probe; Coils; Digital signal processing; Digital signal processors; Eddy currents; Giant magnetoresistance; Magnetic sensors; Probes; Process control; Signal processing; Voltage control; digital signal processor; magnetoresistances sensors; non-destructive testing; uniform eddy current probe;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
ISSN :
1091-5281
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2010.5488189
Filename :
5488189
Link To Document :
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