• DocumentCode
    2689062
  • Title

    Robust small sample properties for likelihood based confidence regions

  • Author

    Barbé, Kurt ; Schoukens, Johan

  • Author_Institution
    Dept. ELEC, Vrije Univ. Brussel, Brussels, Belgium
  • fYear
    2010
  • fDate
    3-6 May 2010
  • Firstpage
    392
  • Lastpage
    396
  • Abstract
    Many measurement applications, in particular for biological, biomedical and biochemical systems, deals with the problem that only short data records are available. This problem implies that many powerful statistical tools are not applicable since these tools are based on asymptotic results. No user-friendly guidelines are available when dealing which such sparse datasets.In contrast to an estimator, one often uses an interval estimate when dealing with small data-records. An interval estimate specifies a range within which the parameter is estimated to lie. Confidence intervals are commonly reported in tables or graphs along with point estimates of the same parameters, to show the reliability of the estimates. In this paper, we study the robustness of asymptotically ´optimal´ confidence regions to small/finite sample effects. Our study reveals immediate guidelines to the user when dealing with short records.
  • Keywords
    estimation theory; measurement systems; measurement theory; measurement uncertainty; sampling methods; asymptotically optimal confidence regions; biochemical system; biological system; biomedical system; confidence interval; interval estimate; likelihood based confidence regions; robust small sample property; Biomedical measurements; Estimation theory; Guidelines; Magnetic heads; Parameter estimation; Particle measurements; Probability density function; Robustness; Testing; Time series analysis; confidence intervals; finite sample properties; hypothesis tests; interval estimation; parameter estimation; short records; time series analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
  • Conference_Location
    Austin, TX
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-2832-8
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2010.5488192
  • Filename
    5488192