Title :
Optimal clocking and enhanced testability for high-performance self-resetting domino pipelines
Author :
Dooply, Ayoob E. ; Yun, Kenneth Y.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
Abstract :
We describe a method to clock the domino pipeline at the maximum rate by using soft synchronizers between pipeline stages and thus allowing “time borrowing” i.e., allowing input signals to arrive at a pipe stage after the clock tick. We show a robust way of placing “roadblocks” (equivalent to slave latches) in each pipe stage to maintain the optimal clock rate. As explicit latches are not required at the pipe stage boundaries, the latch overhead is eliminated. We use the self-resetting scheme to circumvent often performance-limiting precharge timing requirements. We also address several issues regarding the testability of self-resetting domino circuits including scan register design and multiple stuck fault testing
Keywords :
VLSI; delays; design for testability; integrated circuit testing; integrated logic circuits; logic design; logic testing; pipeline processing; synchronisation; timing; DFT; latch overhead elimination; maximum rate; multiple stuck fault testing; optimal clocking; scan register design; self-resetting domino pipelines; soft synchronizers; testability enhancement; Automatic testing; Circuit faults; Circuit testing; Clocks; Latches; Pipelines; Registers; Robustness; Synchronization; Timing;
Conference_Titel :
Advanced Research in VLSI, 1999. Proceedings. 20th Anniversary Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7695-0056-0
DOI :
10.1109/ARVLSI.1999.756049