Title :
A two-dimensional, object-based analog VLSI visual attention system
Author :
Wilson, Charles S. ; Morris, Tonia G. ; DeWeerth, Stephen P.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A two-dimensional object-based analog VLSI model of selective attentional processing has been implemented using a standard 1.2 μm CMOS process. This chip extends previous work modeling object-based selection and scanning by incorporating the circuity and architectural changes necessary for two-dimensional focal plane processing. To balance the need for closely spaced large photodetectors with the space requirements of complex in-pixel processing, the chip implements a multiresolution architecture. The system has he ability to group pixels into objects; this grouping is dynamic, driven solely by the segmentation criterion at the input. In the demonstration system, image intensity has been chosen for the input saliency map and the segmentation is based on spatial lowpass filtering followed by an intensity threshold. We present experimental results
Keywords :
CMOS analogue integrated circuits; CMOS image sensors; VLSI; analogue processing circuits; image processing equipment; image sampling; image segmentation; 1.2 micron; 2D focal plane processing; 2D object-based analog VLSI model; CMOS process; analog VLSI visual attention system; complex in-pixel processing; dynamic grouping; input saliency map; intensity threshold; multiresolution architecture; photodetectors; segmentation criterion; selective attentional processing; spatial lowpass filtering; two-dimensional visual attention system; Analog computers; Biological systems; Biology computing; CMOS process; CMOS technology; Canning; Circuits; Filtering; Hip; Image segmentation; Photodetectors; Power engineering computing; Power system reliability; Semiconductor device modeling; Spatial resolution; Very large scale integration;
Conference_Titel :
Advanced Research in VLSI, 1999. Proceedings. 20th Anniversary Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7695-0056-0
DOI :
10.1109/ARVLSI.1999.756055
