Title :
Formation And Annihilation Of Edge Walls In Thin-film Permalloy Strips
Author :
Mattheis, R. ; McCord, J. ; Ramstock, K. ; Berkov, D.
Author_Institution :
Institut f.Physikalische Hochtechnologie
Keywords :
Hysteresis; Magnetic field measurement; Magnetic sensors; Magnetic switching; Magnetoresistance; Q measurement; Shape measurement; Strips; Switches; Transistors;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597968