DocumentCode :
2689418
Title :
Bhattacharyya distance based kernel method for hyperspectral data multi-class classification
Author :
Zhang, Miao ; Wang, Qiang ; He, Zhi ; Shen, Yi ; Lin, Yurong
Author_Institution :
Dept. of Control Sci. & Eng., Harbin Inst. of Technol., Harbin, China
fYear :
2010
fDate :
3-6 May 2010
Firstpage :
629
Lastpage :
632
Abstract :
Based on the framework of support vector machines (SVM) using one against one (OAO) strategy, a new kernel method based on Bhattacharyya distance is proposed to raise the classification accuracy by combining the characteristics of hyperspectral data. The proposed method takes advantage of the non-uniform information distribution of hyperspectral data and makes the band with greater separability play a more important role during the process of classification. Meanwhile in consideration of the intrinsic binary property of each OAO-SVM classifier, we use the Bhattacharyya distance of the corresponding two species as the spectrally weighted coefficients, which ensure each classifier get its own weights of separability and then lower its classification error. In typical AVIRIS data multi-class classification experiments, using the radial basis function as the basic kernel function, the average accuracies of the proposed method are efficiently improved comparing with standard SVM.
Keywords :
geophysics computing; pattern classification; support vector machines; Bhattacharyya distance; OAO; SVM; hyperspectral data multiclass classification; kernel method; nonuniform information distribution; one against one strategy; support vector machines; Data engineering; Electronic mail; Helium; Hyperspectral imaging; Hyperspectral sensors; Infrared sensors; Infrared spectra; Kernel; Support vector machine classification; Support vector machines; Bhattacharyya distance; hyperspectral data; kernel method; multi-class classification; support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
ISSN :
1091-5281
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2010.5488215
Filename :
5488215
Link To Document :
بازگشت