Title :
A self-testing ALU using built-in current sensing
Author :
Nigh, Phil ; Maly, Wojciech
Abstract :
A CMOS ALU (arithmetic logic unit) chip containing built-in current (BIC) sensors, which perform self-testing of the ALU, is described. The performance of two ALUs (one with and one without a BIC sensor) is analyzed by using externally applied test vectors and linear feedback shift register for BIC and for stuck-fault testing. The results demonstrate that the BIC testing methodology is well suited for initial die testing of CMOS ICs as well as for concurrent self-testing of highly reliable systems
Keywords :
CMOS integrated circuits; automatic testing; integrated circuit testing; integrated logic circuits; logic testing; CMOS ICs; arithmetic logic unit; built-in current sensing; highly reliable systems; initial die testing; self-testing ALU; stuck-fault testing;
Conference_Titel :
Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/CICC.1989.56807
