DocumentCode :
2689540
Title :
Field tests on current carrying performances of 1000 kV GIS
Author :
Yamagata, Yoshibumi ; Shimoda, Nobuhiro ; Shimizu, Yasutaka ; Ohno, Masatomo ; Kobayashi, Masatorno ; Sasamori, Kenji
Author_Institution :
Tokyo Electr. Power Co. Inc., Japan
Volume :
2
fYear :
1999
fDate :
11-16 Apr 1999
Firstpage :
495
Abstract :
Field tests on 1000 kV (UHV) gas insulated switchgear (GIS) substation equipment have been conducted. This paper presents mainly the results of a temperature rise test which demonstrates the mechanical reliability of the GIS. The specified value of induced current of the enclosure and shunt bars among phases is set as much as 100% of rated normal current. The average temperature of four points defined on GIS enclosure surface is adopted as the base temperature for evaluation of thermal expansion and thermal stress of the enclosure. The limit of temperature rise for the GIS enclosure is as high as 65 K according to the revised specification
Keywords :
gas insulated switchgear; reliability; switchgear testing; temperature measurement; thermal expansion; thermal stresses; 1000 kV; GIS enclosure surface; current carrying performance; enclosure; gas insulated switchgear; induced current; mechanical reliability; shunt bars; solar radiation; substation equipment; temperature rise test; thermal expansion; thermal stress; Bars; Gas insulation; Geographic Information Systems; Performance evaluation; Substations; Switchgear; Temperature; Testing; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Transmission and Distribution Conference, 1999 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-5515-6
Type :
conf
DOI :
10.1109/TDC.1999.756103
Filename :
756103
Link To Document :
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