DocumentCode
2689577
Title
Testing and failure analysis methodology of the NS32532 microprocessor
Author
Shihadeh, E. ; Beck, M. ; Biran, D. ; Hoffman, Y. ; Liran, T. ; Maytal, B. ; Milstein, Y. ; Nasrallah, R. ; Nevo, Y.
fYear
1989
fDate
15-18 May 1989
Abstract
A methodology is described for testing the NS32532 32 bit microprocessor to increase the yield and reliability. It is based on an intensive use of test data collection, continuous use of data analysis, and various failure-analysis methods. The use of the methodology enabled the authors to locate easily process problems and topographies that are sensitive to process marginalities and can be easily modified to increase yield. They also identified circuit sensitivities, speed problems, and test instabilities, which enabled them to increase the speed and the overall yield of the product as well as the test reliability
Keywords
circuit reliability; failure analysis; integrated circuit testing; logic testing; microprocessor chips; 32 bit; NS32532 microprocessor; circuit sensitivities; data analysis; failure analysis methodology; speed problems; test data collection; test instabilities; test reliability; testing; yield improvement;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
Conference_Location
San Diego, CA, USA
Type
conf
DOI
10.1109/CICC.1989.56813
Filename
5726280
Link To Document