Title :
Wide pressure range operation of air-coupled CMUTs
Author :
Min-Chieh Ho ; Kupnik, Mario ; Kwan Kyu Park ; Eckhoff, Kristian ; Khuri-Yakub, Butrus T.
Author_Institution :
Stanford Univ., Stanford, CA, USA
Abstract :
We present measurement results of capacitive micromachined ultrasonic transducers (CMUTs) in permanent contact mode over a wide pressure range (1 - 8 atm). The CMUT plates are in contact with the bottom of the cavities due to atmospheric pressure, even without any dc bias voltage. The electrical input impedance at various dc bias voltages are measured at elevated pressure to characterize individual devices. The open and short circuit resonant frequencies are extracted from the impedance data, and the acoustic performance of pairs of devices is evaluated by performing pitch-catch measurements. A frequency matching method is proposed and used to determine the optimal dc bias voltages for the transmitting and receiving CMUTs individually. Our electrical impedance results show good agreement with the finite element model results (modal and harmonic analysis performed with ANSYS) over the entire pressure range. Moreover, the pitch-catch measurement results validate the proposed frequency matching method for an optimal biasing scheme, and a received signal with good signal-to-noise ratio of 45 dB was observed at a pressure of 7 atm. In conclusion, the behavior of CMUTs in permanent contact mode can be predicted well with our FEA, and they are indeed a promising solution in providing ultrasonic transducers that can operate over a wide pressure range.
Keywords :
capacitive sensors; electric impedance measurement; finite element analysis; harmonic analysis; micromachining; modal analysis; ultrasonic transducers; ANSYS; CMUT plates; FEA; acoustic performance; air-coupled CMUT; capacitive micromachined ultrasonic transducers; electrical input impedance; finite element model; frequency matching method; harmonic analysis; impedance data; modal analysis; open circuit resonant frequency; optimal biasing scheme; optimal dc bias voltage determination; permanent contact mode; pitch-catch measurements; receiving CMUT; short circuit resonant frequency; signal-to-noise ratio; transmitting CMUT; wide pressure range operation; Acoustics; Frequency measurement; Impedance; Impedance measurement; Pressure measurement; RLC circuits; Voltage measurement; CMUT; FEA; electrical impedance; permanent contact mode; pitch-catch; wide pressure range;
Conference_Titel :
Ultrasonics Symposium (IUS), 2012 IEEE International
Conference_Location :
Dresden
Print_ISBN :
978-1-4673-4561-3
DOI :
10.1109/ULTSYM.2012.0023