Title :
Rules-based algorithm for detecting transient overvoltages due to capacitor switching and statistical analysis of capacitor switching in distribution systems
Author :
Sabin, D. Daniel ; Grebe, Thomas E. ; Brooks, Daniel L. ; Sundaram, Ashok
Author_Institution :
Electrotek Concepts Inc., Knoxville, TN, USA
Abstract :
Numerous power providers and electric power end-users presently monitor their systems with specialized power quality monitoring instruments. These monitors employ different triggering algorithms for capturing variations in power quality. Due to their simple design, the algorithms will capture many measurements, with only a subset representing transient overvoltages due to capacitor switching. The power providers and end-users performing this monitoring have need of quickly and efficiently identifying this capacitor switching subset without manually analyzing individually the many other disturbances. This paper explores the application of a rules-based algorithm for identifying capacitor switching transients in a monitoring project conducted on 24 utility systems across the United States. Statistical analysis on the identified transient overvoltages is also presented, with particular focus on the peak magnitude of the transient, event duration, principal switching frequency, and hour of day of occurrence
Keywords :
capacitor switching; distribution networks; overvoltage; power supply quality; power system measurement; statistical analysis; switching transients; voltage measurement; United States; capacitor switching; distribution systems; event duration; power quality monitoring instruments; power quality variations; rules-based algorithm; statistical analysis; switching frequency; transient overvoltages detection; transient peak magnitude; triggering algorithms; Algorithm design and analysis; Capacitors; Instruments; Monitoring; Performance analysis; Power quality; Statistical analysis; Surges; Switching frequency; Transient analysis;
Conference_Titel :
Transmission and Distribution Conference, 1999 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-5515-6
DOI :
10.1109/TDC.1999.756124