Title :
Bistatic electromagnetic scattering from a stack of two rough interfaces using the geometric optics approximation
Author :
Pinel, N. ; Bourlier, C. ; Saillard, J.
Author_Institution :
Ecole polytech. de l´´Universite de Nantes
Abstract :
Many asymptotic models of electromagnetic scattering from a single rough interface have been developed over the last years. By contrast, few asymptotic models have been developed on stacks of rough interfaces. Moreover, most of them are difficult to implement numerically, and demand extensive computing time. To our knowledge, the specific case of very rough surfaces comparatively to the incident wavelength has not been treated before, which is the context of this paper. At the conference, the model in two dimensions as well as in three dimensions are presented; here, we focus on the two-dimensional case of the model, and its validation by comparison with a reference numerical method
Keywords :
electromagnetic wave scattering; geometrical optics; numerical analysis; radar cross-sections; surface electromagnetic waves; bistatic electromagnetic scattering; geometric optics approximation; incident wavelength; radar cross section; rough interfaces; very rough surfaces; Electromagnetic scattering; Geometrical optics; Laser radar; Optical scattering; Optical surface waves; Radar scattering; Reflection; Rough surfaces; Surface roughness; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
1-4244-0123-2
DOI :
10.1109/APS.2006.1710611