• DocumentCode
    2689966
  • Title

    Built-in self-repair circuit for high-density ASMIC

  • Author

    Sawada, Kazuhiro ; Sakurai, Takayasu ; Uchino, Yukinori ; Yamada, Kaoruko

  • fYear
    1989
  • fDate
    15-18 May 1989
  • Abstract
    A built-in self-repair (BISR) circuit is introduced to achieve high yield and to overcome the testing problem for high-density application-specific memory ICs (ASMIC). The feasibility of BISR is demonstrated for a 1-Mb DRAM embedded gate array. A die-sort strategy using BISR is also discussed
  • Keywords
    application specific integrated circuits; automatic testing; integrated memory circuits; random-access storage; 1 Mbit; ASIC; BISR; DRAM embedded gate array; application-specific memory ICs; built-in self-repair; die-sort strategy; dynamic RAM; high-density ASMIC; self-testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 1989., Proceedings of the IEEE 1989
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • DOI
    10.1109/CICC.1989.56835
  • Filename
    5726302
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2689966