Title :
An Accurate FET Modelling from Measured S-Parameters
Abstract :
A new modelling algorithm has been developed which extracts a small-signal microwave equivalent circuit of an FET from measured S-parameters. The combinations of properly selected circuit elements with an S-parameter to be least-squares fitted greatly improve the accuracy and consistency of modelling, The absolute accuracy of determining element values was estimated to be better than 3 %.
Keywords :
Data mining; Equivalent circuits; Frequency measurement; Microwave FETs; Microwave measurements; Microwave technology; Nonlinear equations; Q measurement; Roentgenium; Scattering parameters;
Conference_Titel :
Microwave Symposium Digest, 1986 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
DOI :
10.1109/MWSYM.1986.1132197
