• DocumentCode
    2690124
  • Title

    An Accurate FET Modelling from Measured S-Parameters

  • Author

    Kondoh, H.

  • fYear
    1986
  • fDate
    2-4 June 1986
  • Firstpage
    377
  • Lastpage
    380
  • Abstract
    A new modelling algorithm has been developed which extracts a small-signal microwave equivalent circuit of an FET from measured S-parameters. The combinations of properly selected circuit elements with an S-parameter to be least-squares fitted greatly improve the accuracy and consistency of modelling, The absolute accuracy of determining element values was estimated to be better than 3 %.
  • Keywords
    Data mining; Equivalent circuits; Frequency measurement; Microwave FETs; Microwave measurements; Microwave technology; Nonlinear equations; Q measurement; Roentgenium; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1986 IEEE MTT-S International
  • Conference_Location
    Baltimore, MD, USA
  • ISSN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.1986.1132197
  • Filename
    1132197