DocumentCode :
2690136
Title :
Illumination invariant measurement of mechanical dimensions using a multiple segmentation method
Author :
Ohliger, Kevin ; Edeler, Torsten ; Hussmann, Stephan ; Mertins, Alfred
Author_Institution :
Dept. of Electr. Eng. & Inf. Technol., Westcoast Univ. of Appl. Sci., Heide, Germany
fYear :
2010
fDate :
3-6 May 2010
Firstpage :
1008
Lastpage :
1013
Abstract :
In many industrial processes the need for better quality assurance leads to a higher degree of process automation which often includes an optical inspection system. In our case the mechanical dimensions of printed micro structures on ceramic substrates have to be evaluated. Therefore an optical inspection system providing high resolution images with 12288 pixel × 14000 pixel was developed. The segmentation task in this setup is challenging caused by the huge amount of data and the different appearances of the micro structures depending on size, material, and humidity. For this purpose we present a multiple segmentation method and evaluate the results against common used segmentation methods on a number of different real images. Experimental results show that the proposed optical inspection system and algorithms can achieve an illumination invariant high resolution measurement of the micro structures.
Keywords :
image segmentation; optical resolving power; high resolution images; illumination invariant measurement; mechanical dimensions; multiple segmentation method; optical inspection system; printed micro structures; process automation; Automatic optical inspection; Automation; Ceramics; Image resolution; Image segmentation; Lighting; Mechanical variables measurement; Optical materials; Pixel; Quality assurance; AMSER; MSER; ROI; adapted maximally stable extremal regions; high resolution; illumination invariant; maximally stable extremal regions; optical inspection system; region of interest; segmentation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
ISSN :
1091-5281
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2010.5488256
Filename :
5488256
Link To Document :
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