• DocumentCode
    2690191
  • Title

    Process variables in the reflow soldering of surface mount

  • Author

    Conway, P.P. ; Williams, D.J. ; Tang, A.C.T. ; Sargent, P.M. ; Whalley, D.C.

  • Author_Institution
    Loughborough Univ. of Technol., UK
  • fYear
    1990
  • fDate
    0-0 1990
  • Firstpage
    385
  • Lastpage
    394
  • Abstract
    The variety of surface mount device (SMD) terminations, solder pad shape and surface properties, soldering processes, and properties of solder pastes currently leads to ill-understood and ad hoc methods of specifying component terminations, joint geometry, and soldering parameters and to the consequent risk of reduced process yields for SMD-to-printed-circuit-board connections. The authors attempt to relate the design and process variables to their effects on final joint quality and production process stability. It is pointed out that the migration of manufacturers from vapor-phase to infrared (IR) reflow soldering has gone some way to reduce the occurrences of many of the reflow soldering defects. However, despite the improvement provided with the IR reflow technique, any gains in reducing the number of occurrences per joint of these defects will to a large extent be counteracted by the significant increase in interconnections expected in the near future.<>
  • Keywords
    printed circuit manufacture; soldering; surface mount technology; SMD terminations; SMD to PCB connections; final joint quality; joint geometry; process variables; production process stability; properties of solder pastes; reflow soldering; risk of reduced process yields; solder pad shape; soldering parameters; soldering processes; specifying component terminations; surface mount device; surface properties; Circuit testing; Design automation; Lead; Manufacturing; Packaging; Process design; Production; Reflow soldering; Samarium; Surface-mount technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1990, IEMT Conference., 8th IEEE/CHMT International
  • Conference_Location
    Baveno, Italy
  • Type

    conf

  • DOI
    10.1109/IEMT8.1990.171063
  • Filename
    171063