Title :
The INL verification puzzle
Author :
Leip, David ; Lia, Dennis ; Max, Solomon
Author_Institution :
LTX-Credence Corp., Norwood, MA, USA
Abstract :
It is impractical to measure the INL (Integral Non-Linearity) of a high resolution precision source to tight specifications with the requisite accuracy (0.00008%) at all possible source values. A method is described that was used to guarantee the accuracy of a precision source with a resolution of 24 bits, in a timely fashion. Experimental results from testing multiple instruments are described.
Keywords :
measurement systems; INL verification puzzle; integral nonlinearity; multiple instrument testing; Calibration; Difference equations; Instruments; Integral equations; Linearity; Manufacturing processes; Measurement uncertainty; Noise measurement; Testing; Topology; ATE; Accuracy; DAC; DNL; INL; Linearity; Measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5488266
