DocumentCode :
2690314
Title :
Advances in Low-Cost Component Manufacturing: Avantek´s Die Manufacturing Facility in Newark, California
Author :
Crowley, K.
fYear :
1986
fDate :
2-4 June 1986
Firstpage :
433
Lastpage :
435
Abstract :
The microwave semiconductor industry is changing. Unit demand is rising and pressure to reduce price per function follows. If the industry is to meet these challenges, it must evolve rapidly. Analysis of the digital silicon industry may provide clues as to how to proceed.
Keywords :
Circuit testing; Costs; Electrostatic discharge; Fabrication; Manufacturing industries; Materials testing; Microwave circuits; Packaging; Production facilities; Semiconductor device testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1986 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
ISSN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.1986.1132213
Filename :
1132213
Link To Document :
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