Title :
Geometrical and Topological Urban Areas Characterization using TerraSAR-X Data
Author :
Chaabouni-Chouayakh, H. ; Datcu, Mihai
Author_Institution :
German Aerosp. Center, Wessling
Abstract :
With the launch of the German TerraSAR-X system in June 2007, a new generation of high-resolution spaceborne synthetic aperture radar (SAR) data is available; which should facilitate the interpretation of urban environments. This article proposes a new automatic tool for geometric and topological urban areas characterization. Our approach is divided into three main steps. First, a bright linear structures detector is applied to extract the geometrical information. Then, a graph-based spatial characterization is used to model the topological relationships between the different detected bright pixels (nodes). Next, a classification by examining the profile of the distributions of the angles between neighboring nodes, is performed in order to label the linked structures. Evaluations of the proposed approach in characterizing the geometry and topology of urban areas were carried out using TerraSAR-X data over three different cities: Las Vegas in the United States, Paris in France and Cairo in Egypt.
Keywords :
geophysical techniques; image classification; remote sensing by radar; spaceborne radar; synthetic aperture radar; AD 2007 06; Cairo; Egypt; France; German TerraSAR-X system; Las Vegas; Paris; United States; bright linear structures detector; detected bright pixels; four-step processing chain; geometrical urban areas characterization; graph-based spatial characterization; high-resolution Synthetic Aperture Radar; neighboring nodes classification; spaceborne SAR data; topological urban areas characterization; Adaptive optics; Buildings; Cities and towns; Data mining; Detectors; Image edge detection; Labeling; Optical scattering; Synthetic aperture radar; Urban areas; Geometrical characterization; TerraSAR-X data; Topological characterization; Urban areas;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4779681