Title :
Application of metal-enhanced fluorescence technology in evanescent wave fluorescent biosensor
Author :
Su, Yu-Zheng ; Hung, Min-Wei ; Wu, Wen-Hong ; Huang, Kuo-Cheng ; Chiang, Huihua Kenny
Author_Institution :
Instrum. Technol. Res. Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan
Abstract :
Evanescent wave fluorescent sensors have developed for 30 years. Nonetheless, the technology continues to evolve with new breakthroughs in optics, biochemistry, and chemical engineering. Recently, there have been explosive developments in the Metal-Enhanced Fluorescence (MEF) technology to favorably modify the spectral properties and to alleviate photo-physical constraints. We report the development of core-shell nanoparticles with the silver core and SiO2 shell for potential applications in fiber optic biosensor. The fluorescence intensity of the fluorescence probe (Fluorescein isothiocyanate, FITC) doped core-shell nanoparticles was approximately 50-fold higher than that without core-shell nanoparticles doping. In addition, four different kinds of organic solvents are used in this study and found to have influence on the fluorescence intensity from 1.3 to over 100 times. We conclude that core-shell nanoparticles have capability to enhance the fiber optic sensing through amplifying fluorescence intensity and expect that their potential applications are used in a variety of biological applications.
Keywords :
biosensors; fibre optic sensors; fluorescence; nanoparticles; probes; silicon compounds; silver; Ag-SiO2; evanescent wave fluorescent biosensor; fiber optic biosensor; fluorescein isothiocyanate; fluorescence intensity; fluorescence probe doped core-shell nanoparticle; metal-enhanced fluorescence technology; organic solvent; photophysical constraint; silver core; Biochemistry; Biomedical optical imaging; Biosensors; Chemical and biological sensors; Chemical technology; Fluorescence; Nanoparticles; Optical fibers; Optical sensors; Optical surface waves; Biosensor; Fluorescence; Metalenhanced fluorescence; Nanoparticles;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2010 IEEE
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2832-8
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2010.5488270