DocumentCode :
2690719
Title :
Analysis and behavioral study on insertion loss of an NLTL circuit
Author :
Lan, X. ; Fong, F. ; Kintis, M. ; Wong, T.
Author_Institution :
RF Product Center, Northrop Grumman Corp., Redondo Beach, CA
fYear :
2006
fDate :
9-14 July 2006
Firstpage :
883
Lastpage :
886
Abstract :
A simple method for calculating an NLTL circuit´s loss is presented. This approach is simple and intuitive for understanding and studying the behaviors of insertion loss slopes and spreading effects over frequency at different varactor biasing voltages. Factors that control the insertion loss slope and spreading are identified. In addition, the optimization of insertion loss as a function of circuit interconnection inductance relationship is also reported, with the condition for the existence of optimal range established. The approach and results can be readily applied to different NLTL designs in arriving at optimal NLTL circuits
Keywords :
inductance; interconnections; nonlinear network analysis; transmission line theory; varactors; behavioral study; circuit interconnection inductance relationship; insertion loss slopes; nonlinear transmission line structures; optimal NLTL circuit; spreading effects; varactor biasing voltages; Attenuation; Broadband antennas; Diodes; Distributed parameter circuits; Equations; Inductance; Insertion loss; Power transmission lines; Varactors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
1-4244-0123-2
Type :
conf
DOI :
10.1109/APS.2006.1710670
Filename :
1710670
Link To Document :
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