• DocumentCode
    2691147
  • Title

    Laser welding for hermetic sealing of large MIC package

  • Author

    Scatamacchia, Antonio

  • Author_Institution
    Elettronica SpA, Rome, Italy
  • fYear
    1990
  • fDate
    0-0 1990
  • Firstpage
    493
  • Lastpage
    502
  • Abstract
    A comparison of different methods for producing MIC (microwave integrated circuit) package sealing shows that laser technology provides the best results with regard to hermetic welding, especially with high-conductivity materials. A pulsed YAG:Nd laser is most suitable for numerous high-conductivity materials. For an MIC package, aluminum appeared to be excellent, owing to its mechanical, thermal, and electrical properties. Several approaches have been tested for cover-housing interface to achieve hermetic welds in aluminum structures. Realization of the cover with a high-silicon-content aluminum was found to be particularly advantageous. Welding was performed by directly joining the cover to the aluminum case without any interposed material. This solution is the simplest for large cases (>20 cm/sup 3/) of different shapes. The laser brazing of RF coaxial feedthroughs in filling holes of an aluminum case was also investigated.<>
  • Keywords
    aluminium; aluminium alloys; brazing; hybrid integrated circuits; laser beam welding; microwave integrated circuits; neodymium; packaging; silicon alloys; solid lasers; Al housings; Al-Si housings; RF coaxial feedthroughs; YAl5O12:Nd; cover-housing interface; electrical properties; filling holes; hermetic sealing; hermetic welding; hermetic welds; high-conductivity materials; large MIC package; large cases; laser brazing; laser technology; laser welding; pulsed YAG:Nd laser; Aluminum; Integrated circuit packaging; Integrated circuit technology; Masers; Microwave integrated circuits; Microwave technology; Microwave theory and techniques; Optical materials; Sealing materials; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1990, IEMT Conference., 8th IEEE/CHMT International
  • Conference_Location
    Baveno, Italy
  • Type

    conf

  • DOI
    10.1109/IEMT8.1990.171070
  • Filename
    171070