DocumentCode
2691241
Title
Discontinuities in Fin-Line on Semiconductor Substrate
Author
Uhde, K.
fYear
1986
fDate
2-4 June 1986
Firstpage
703
Lastpage
706
Abstract
Discontinuities in both slot width and substrate complex dielectric constant are investigated theoretically. The fin-line slot pattern is defined on a double-layer substrate with finite conductivity. Numerical results are presented showing that a step in the permittivity can almost be compensated for by a step in the slotwidth.
Keywords
Conductivity; Dielectric constant; Dielectric substrates; Dielectrics and electrical insulation; Electromagnetic scattering; Equations; Finline; Permittivity; Phase shifters; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1986 IEEE MTT-S International
Conference_Location
Baltimore, MD, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1986.1132286
Filename
1132286
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