Title :
Discontinuities in Fin-Line on Semiconductor Substrate
Abstract :
Discontinuities in both slot width and substrate complex dielectric constant are investigated theoretically. The fin-line slot pattern is defined on a double-layer substrate with finite conductivity. Numerical results are presented showing that a step in the permittivity can almost be compensated for by a step in the slotwidth.
Keywords :
Conductivity; Dielectric constant; Dielectric substrates; Dielectrics and electrical insulation; Electromagnetic scattering; Equations; Finline; Permittivity; Phase shifters; Switches;
Conference_Titel :
Microwave Symposium Digest, 1986 IEEE MTT-S International
Conference_Location :
Baltimore, MD, USA
DOI :
10.1109/MWSYM.1986.1132286
