DocumentCode :
269151
Title :
Cu(In,Ga)Se _{\\bf 2} Solar Cells With Varying Na Content Prepared on Nominally Alkali-Free Glass Substrates
Author :
Salomé, P.M.P. ; Hultqvist, A. ; Fjällström, Viktor ; Edoff, M. ; Aitken, B. ; Vaidyanathan, Karthikeyan ; Zhang, Kai ; Fuller, K. ; Kosik Williams, C.
Author_Institution :
Angstrom Solar Center, Uppsala Univ., Uppsala, Sweden
Volume :
3
Issue :
2
fYear :
2013
fDate :
Apr-13
Firstpage :
852
Lastpage :
858
Abstract :
In this paper, Cu(In,Ga)Se2 (CIGS) thin-film solar cells are prepared on nominally alkali-free glass substrates using an in-line CIGS growth process. As compared with, for example, borosilicate glass or quartz, the glass is engineered to have similar thermal expansion coefficient as soda-lime glass (SLG) but with alkali content close to zero. Na is incorporated in the CIGS material using an ex-situ deposited NaF precursor layer evaporated onto the Mo back contact. Several thicknesses of the NaF layer were tested. The results show that there is a process window, between 15 and 22.5 nm NaF, where the solar cell conversion efficiency is comparable with or exceeding that of SLG references. The effect of an NaF layer that is too thin on the solar cell parameters was mainly lowering the open-circuit voltage, which points to a lower effective dopant concentration in the CIGS layer and is also consistent with presented C - V measurements and modeling results. For excessively thick NaF layers, delamination of the CIGS layer occurred. Additional measurements, such as scanning electron microscopy (SEM), secondary ion mass spectrometry, capacitance-voltage analysis (C - V), time-resolved photoluminescence (TRPL), external quantum efficiency (EQE), current-voltage analysis (J-V), and modeling, are presented, and the results are discussed.
Keywords :
capacitance; copper compounds; gallium compounds; indium compounds; photoluminescence; scanning electron microscopy; secondary ion mass spectra; semiconductor growth; semiconductor thin films; sodium; solar cells; ternary semiconductors; thermal expansion; time resolved spectra; CIGS layer delamination; CIGS material; CIGS thin-film solar cells; Cu(InGa)Se2:Na; Mo back contact; Na content; NaF layer effect; NaF layer thicknesses; NaF precursor layer; SEM; SIMS; SiO2; alkali content; borosilicate glass; capacitance-voltage analysis; capacitance-voltage measurements; current-voltage analysis; effective dopant concentration; evaporation; external quantum efficiency; in-line CIGS growth process; nominally alkali-free glass substrates; open-circuit voltage; process window; quartz; scanning electron microscopy; secondary ion mass spectrometry; size 15 nm to 22.5 nm; soda-lime glass; solar cell conversion efficiency; solar cell parameters; thermal expansion coefficient; time-resolved photoluminescence; Charge carrier lifetime; Current measurement; Glass; Performance evaluation; Photovoltaic cells; Substrates; Temperature measurement; Photovoltaic cells; photovoltaic systems; solar cells; solar energy; solids; substrates; thin films;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2013.2247655
Filename :
6475138
Link To Document :
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