Title :
Automatic opacity detection in retro-illumination images for cortical cataract diagnosis
Author :
Li, Huiqi ; Liling Ko ; Joo Hwee Lim ; Jiang Liu ; Wong, Damon Wing Kee ; Tien Yin Wong ; Ying Sun
Author_Institution :
Inst. for Infocomm Res., Agency for Sci., Technol. & Res., Singapore
fDate :
June 23 2008-April 26 2008
Abstract :
Computer aided analysis of medical images, a unique type of non-text media, can facilitate clinical diagnosis. As an example, an automatic opacity detection approach is proposed in this paper to grade cortical cataract more objectively. The automatic pupil detection is performed by detecting the strongest edges on the convex hull and ellipse fitting using nonlinear least square method. The cortical opacity is detected by radial edge detection and post-processing. The automatic grades are assigned following Wisconsin cataract grading protocol. The accuracy of pupil detection is 98.2%. The mean error of opacity area detection is 7 percent compared with the result of human grader. And 86.3% accurate grades of cortical cataract are achieved. This is the first time that the spoke-like feature is utilized in the automatic detection of cortical cataract to separate from other opacity types. The encouraging results show that it is probable to apply the proposed approach to clinical diagnosis later.
Keywords :
curve fitting; edge detection; eye; least squares approximations; medical image processing; opacity; Wisconsin cataract grading protocol; automatic opacity detection; automatic pupil detection; clinical diagnosis; computer aided analysis; convex hull; cortical cataract diagnosis; cortical cataract grading; ellipse fitting; medical images; nonlinear least square method; radial edge detection; retro-illumination images; Biomedical imaging; Blindness; Clinical diagnosis; Computer aided analysis; Crystallization; Digital images; Humans; Image edge detection; Lenses; Medical diagnostic imaging; cortical cataract; medical image; opacity detection;
Conference_Titel :
Multimedia and Expo, 2008 IEEE International Conference on
Conference_Location :
Hannover
Print_ISBN :
978-1-4244-2570-9
Electronic_ISBN :
978-1-4244-2571-6
DOI :
10.1109/ICME.2008.4607494