DocumentCode :
2692001
Title :
On-state characteristics of SiC thyristors for the 8–20 kV regime
Author :
Walden, G.G. ; Cooper, J.A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2009
fDate :
22-24 June 2009
Firstpage :
91
Lastpage :
92
Abstract :
Silicon carbide is attractive for high-voltage power switching applications because its critical field is 8-10x higher than silicon. In SiC MOSFETs, the drift region resistance increases as the square of the blocking voltage, and for sufficiently high voltages (>10 kV) this resistance becomes a major limitation. Bipolar devices (BJTs, IGBTs, and thyristors) inject minority carriers into the drift region, resulting in conductivity modulation that dramatically reduces this resistance. BJTs and IGBTs are single-injection devices, but thyristors inject carriers into the drift region from both sides, resulting in increased conductivity modulation. Hence, thyristors are attractive for high-voltage, low-frequency applications such as electric power utility distribution.
Keywords :
MOSFET; silicon compounds; thyristors; SiC; SiC MOSFET; SiC thyristors; bipolar devices; blocking voltage; conductivity modulation; drift region resistance; high-voltage power switching; on-state characteristics; silicon carbide; Annealing; Anodes; Conductivity; Electric resistance; Fingers; Insulated gate bipolar transistors; Silicon carbide; Temperature; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2009. DRC 2009
Conference_Location :
University Park, PA
Print_ISBN :
978-1-4244-3528-9
Electronic_ISBN :
978-1-4244-3527-2
Type :
conf
DOI :
10.1109/DRC.2009.5354855
Filename :
5354855
Link To Document :
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