DocumentCode :
2692139
Title :
Fermi-level unpinning on GaAs (111)A surface with direct ALD Al2O3
Author :
Xu, M. ; Wu, Y.Q. ; Ye, P.D.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
2009
fDate :
22-24 June 2009
Firstpage :
111
Lastpage :
112
Abstract :
Although high-performance inversion-mode InGaAs NMOSFETs are demonstrated, high performance GaAs MOSFETs with directly deposited high-k dielectrics remain a big challenge. Some researchers believe that Fermi-level of GaAs is intrinsically pinned at the mid-gap with directly deposited ALD AI2O3 In this paper, we systematically study the electrical properties of ALD AI2O3 NMOSCAPs, PMOSCAPs, NMOSFETs and PMOSFETs on GaAs (111)A and use (100) as a reference. (lll)A is a pure Ga polar surface instead of (100) GaAs unpolar surface. The results obtained on GaAs (lll)A surface are astonishingly different from those on GaAs (100) surface. Multi-probe investigations confirm that Fermi-level of GaAs is unpinned with direct ALD AI2O3.
Keywords :
Fermi level; III-V semiconductors; MOSFET; alumina; gallium arsenide; high-k dielectric thin films; indium compounds; wide band gap semiconductors; Al2O3; Fermi-level; InGaAs; NMOSCAP; PMOSCAP; PMOSFET; electrical properties; high-k dielectrics; high-performance inversion-mode NMOSFET; polar surface; unpolar surface; Aluminum oxide; Capacitance; Frequency measurement; Gallium arsenide; High-K gate dielectrics; Indium gallium arsenide; MOSFETs; Passivation; Personal digital assistants; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 2009. DRC 2009
Conference_Location :
University Park, PA
Print_ISBN :
978-1-4244-3528-9
Electronic_ISBN :
978-1-4244-3527-2
Type :
conf
DOI :
10.1109/DRC.2009.5354864
Filename :
5354864
Link To Document :
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