• DocumentCode
    2692139
  • Title

    Fermi-level unpinning on GaAs (111)A surface with direct ALD Al2O3

  • Author

    Xu, M. ; Wu, Y.Q. ; Ye, P.D.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2009
  • fDate
    22-24 June 2009
  • Firstpage
    111
  • Lastpage
    112
  • Abstract
    Although high-performance inversion-mode InGaAs NMOSFETs are demonstrated, high performance GaAs MOSFETs with directly deposited high-k dielectrics remain a big challenge. Some researchers believe that Fermi-level of GaAs is intrinsically pinned at the mid-gap with directly deposited ALD AI2O3 In this paper, we systematically study the electrical properties of ALD AI2O3 NMOSCAPs, PMOSCAPs, NMOSFETs and PMOSFETs on GaAs (111)A and use (100) as a reference. (lll)A is a pure Ga polar surface instead of (100) GaAs unpolar surface. The results obtained on GaAs (lll)A surface are astonishingly different from those on GaAs (100) surface. Multi-probe investigations confirm that Fermi-level of GaAs is unpinned with direct ALD AI2O3.
  • Keywords
    Fermi level; III-V semiconductors; MOSFET; alumina; gallium arsenide; high-k dielectric thin films; indium compounds; wide band gap semiconductors; Al2O3; Fermi-level; InGaAs; NMOSCAP; PMOSCAP; PMOSFET; electrical properties; high-k dielectrics; high-performance inversion-mode NMOSFET; polar surface; unpolar surface; Aluminum oxide; Capacitance; Frequency measurement; Gallium arsenide; High-K gate dielectrics; Indium gallium arsenide; MOSFETs; Passivation; Personal digital assistants; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2009. DRC 2009
  • Conference_Location
    University Park, PA
  • Print_ISBN
    978-1-4244-3528-9
  • Electronic_ISBN
    978-1-4244-3527-2
  • Type

    conf

  • DOI
    10.1109/DRC.2009.5354864
  • Filename
    5354864