• DocumentCode
    2692630
  • Title

    Reliability And Degradation Behavior Of A InGaAsP/InP Waveguide Photodiode For Subscriber Systems

  • Author

    Mawatari, H. ; Fukuda, Motohisa ; Kate, Kiran ; Kozen, A. ; Yuda, M. ; Takeshita, Takaharu ; Uchida, Noriki ; Toba, H.

  • Author_Institution
    NTT Opto-Electronics Laboratory
  • fYear
    1997
  • fDate
    14-18 July 1997
  • Firstpage
    143
  • Lastpage
    143
  • Keywords
    Absorption; Aging; Dark current; Degradation; Electron optics; Indium phosphide; Optical sensors; Photodiodes; Plasma temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 1997. CLEO/Pacific Rim '97., Pacific Rim Conference on
  • Conference_Location
    Chiba, Japan
  • Print_ISBN
    0-7803-3889-8
  • Type

    conf

  • DOI
    10.1109/CLEOPR.1997.610630
  • Filename
    610630
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2692630