Title :
Off-track Response Vs Shield Width At The ABS For Shielded MR Heads
Author :
Partee, C. ; Lansky, R.
Author_Institution :
Quantum Corporation
Keywords :
Costs; Etching; Finite difference methods; Frequency measurement; Geometry; Magnetic heads; Magnetic recording; Magnetoresistance; Signal analysis; Visualization;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597989