New universal physical model for the recoverable part of NBTI degradation

In this study, we propose a new universal electron trapping/detrapping model of interface traps for the recoverable part of negative bias temperature instability (NBTI) using dispersive relaxation time. In particular, our model can separate different phases of NBTI process by different slopes of logarithmic time dependence for the first time. We have also successfully derived a normalized universal relaxation relation of this part of NBTI.