DocumentCode :
2693138
Title :
Integrated approach using neural networks for fault detection and diagnosis
Author :
Yamamoto, Y. ; Venkatasubramanian, V.
fYear :
1990
fDate :
17-21 June 1990
Firstpage :
317
Abstract :
An integrated approach using neural networks for detecting and diagnosing process failures is presented. The system, which consists of three major components, quantitative networks, qualitative networks, and inverse qualitative networks, effectively reduces the inherent ambiguity of forward-mapping neural networks by incorporating the inverse mapping neural networks, which corresponds to the mapping from the fault space to the symptom space, and identifies the most plausible case in a process. The system is tested on four kinds of possible fault groups, including novel single faults, two two-fault groups, and sensor faults. It is shown that, due to the successful integration of quantitative information and qualitative information associated with process data, the system can successfully and substantially improve the diagnostic performance without additional information
Keywords :
fault location; neural nets; process computer control; fault detection; fault diagnosis; integrated approach; inverse mapping; inverse qualitative networks; neural networks; process failures; qualitative networks; quantitative networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 1990., 1990 IJCNN International Joint Conference on
Conference_Location :
San Diego, CA, USA
Type :
conf
DOI :
10.1109/IJCNN.1990.137588
Filename :
5726548
Link To Document :
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