• DocumentCode
    2693138
  • Title

    Integrated approach using neural networks for fault detection and diagnosis

  • Author

    Yamamoto, Y. ; Venkatasubramanian, V.

  • fYear
    1990
  • fDate
    17-21 June 1990
  • Firstpage
    317
  • Abstract
    An integrated approach using neural networks for detecting and diagnosing process failures is presented. The system, which consists of three major components, quantitative networks, qualitative networks, and inverse qualitative networks, effectively reduces the inherent ambiguity of forward-mapping neural networks by incorporating the inverse mapping neural networks, which corresponds to the mapping from the fault space to the symptom space, and identifies the most plausible case in a process. The system is tested on four kinds of possible fault groups, including novel single faults, two two-fault groups, and sensor faults. It is shown that, due to the successful integration of quantitative information and qualitative information associated with process data, the system can successfully and substantially improve the diagnostic performance without additional information
  • Keywords
    fault location; neural nets; process computer control; fault detection; fault diagnosis; integrated approach; inverse mapping; inverse qualitative networks; neural networks; process failures; qualitative networks; quantitative networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1990., 1990 IJCNN International Joint Conference on
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • DOI
    10.1109/IJCNN.1990.137588
  • Filename
    5726548