DocumentCode
2693138
Title
Integrated approach using neural networks for fault detection and diagnosis
Author
Yamamoto, Y. ; Venkatasubramanian, V.
fYear
1990
fDate
17-21 June 1990
Firstpage
317
Abstract
An integrated approach using neural networks for detecting and diagnosing process failures is presented. The system, which consists of three major components, quantitative networks, qualitative networks, and inverse qualitative networks, effectively reduces the inherent ambiguity of forward-mapping neural networks by incorporating the inverse mapping neural networks, which corresponds to the mapping from the fault space to the symptom space, and identifies the most plausible case in a process. The system is tested on four kinds of possible fault groups, including novel single faults, two two-fault groups, and sensor faults. It is shown that, due to the successful integration of quantitative information and qualitative information associated with process data, the system can successfully and substantially improve the diagnostic performance without additional information
Keywords
fault location; neural nets; process computer control; fault detection; fault diagnosis; integrated approach; inverse mapping; inverse qualitative networks; neural networks; process failures; qualitative networks; quantitative networks;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1990., 1990 IJCNN International Joint Conference on
Conference_Location
San Diego, CA, USA
Type
conf
DOI
10.1109/IJCNN.1990.137588
Filename
5726548
Link To Document