Title :
Analysis of electrically large patch phased arrays via CFDTD
Author :
Ho, Thinh Q. ; Hunt, Lilton N. ; Hewett, Charles A. ; Mittra, Raj ; Yu, Wenhua ; Ready, Thomas G. ; Zolnick, Dale A. ; Kragalott, Mark
Author_Institution :
SSCSD 282, San Diego, CA
Abstract :
To validate the CFDTD code, analysis was first carried out on a smaller array with 64 elements. The structure was built up with elements identical to those used in the 10,000-element array. Models of the validation array were constructed using both CFDTD and XFDTD. The array radiation patterns were shown for 0deg, 30deg, 45deg, and 60deg scan angles at the center frequency of 1.75 GHz. The beam was scanned in the Phi = 90deg plane. The solid lines represent CFDTD data while the dotted lines indicate the corresponding XFDTD set. As the beam is steered away from boresight, the 3-dB beamwidth increases from 12.9deg at boresight to 26.2deg at the 60deg scan angle. The first sidelobe level is about 13 dB below the peak when the main beam is pointed at boresight. The total change in peak sidelobe level is 4.0 dB as the beam is scanned from boresight to 60deg. The array directivity calculated with CFDTD is 23.0 dB, which is within 0.2 dB of the value given by XFDTD. Furthermore, the scan loss from 0deg to 60deg is observed to be 3.0 dB with CFDTD and 2.8 dB with XFDTD. These values are consistent with expectations for a well behaved array with 0.5lambda element spacing
Keywords :
antenna phased arrays; antenna radiation patterns; finite difference time-domain analysis; microstrip antenna arrays; 1.75 GHz; 10,000-element array; CFDTD code; XFDTD; array directivity; array radiation patterns; electrically large patch phased arrays; element spacing; validation array; Antenna arrays; Boundary conditions; Concurrent computing; Costs; Educational institutions; Feeds; Frequency; Phased arrays; Power system reliability; Pulse modulation;
Conference_Titel :
Antennas and Propagation Society International Symposium 2006, IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
1-4244-0123-2
DOI :
10.1109/APS.2006.1710856