• DocumentCode
    2693504
  • Title

    Double-port AlN/Sapphire high overtone bulk acoustic resonators for the stabilization of radio-frequency oscillators

  • Author

    Chretien, N. ; Martin, G. ; Lebrasseur, Eric ; Wang, Huifang ; Baron, T. ; Ballandras, S. ; Henaff, E. ; Tomaso, F. ; Chommeloux, L.

  • Author_Institution
    Time & Freq., FEMTO-ST, Besancon, France
  • fYear
    2012
  • fDate
    7-10 Oct. 2012
  • Firstpage
    2210
  • Lastpage
    2213
  • Abstract
    The interest of double-port AlN/Sapphire high overtone bulk acoustic resonators for the stabilization of radiofrequency oscillators is investigated. Resonators are built by depositing AlN onto Sapphire to provide high quality factors, as required for stable oscillators. The resonators are based on laterally-coupled single resonators exchanging energy via a gap of few tens of μm separating them and adjusted to optimize the quality factor. Combining AlN with high acoustic quality materials finally has provided a quality factor of 53,000 at 1.8 GHz (Q.f product of about 9.5 × 1013) at room temperature. An oscillator stabilized with this resonator has been characterized, yielding a phase noise floor of -155 dBc/Hz and an Allan deviation of 10-9 for τ = 1 s.
  • Keywords
    Q-factor; acoustic resonators; phase noise; radiofrequency oscillators; stability; Allan deviation; acoustic quality materials; double port AlN/sapphire high overtone bulk acoustic resonator; phase noise floor; quality factor; radiofrequency oscillators; stabilization; Acoustics; Electrodes; III-V semiconductor materials; Oscillators; Q-factor; Resonant frequency; High overtone Bulk Acoustic Resonator; high quality factors; oscillators; phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2012 IEEE International
  • Conference_Location
    Dresden
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4673-4561-3
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2012.0552
  • Filename
    6562352