DocumentCode
2693598
Title
Optical field characterization using tunneling microstructures
Author
Dragoman, D. ; Dragoman, M.
Author_Institution
Nat. Res. & Dev. Inst. in Microtechnol., Bucharest, Romania
Volume
2
fYear
2000
fDate
2000
Firstpage
393
Abstract
For the first time, the amplitude, wavelength and phase of a light source are determined based on microsystems consisting of arrays of tunneling cantilevers
Keywords
arrays; frequency measurement; light sources; microsensors; optical sensors; optical variables measurement; tunnelling; amplitude; arrays; light source; microsystems; optical field characterization; phase; tunneling cantilevers; tunneling microstructures; wavelength; Bandwidth; Light sources; Microstructure; Optical arrays; Optical interferometry; Phase measurement; Power measurement; Thickness measurement; Tunneling; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2000. CAS 2000 Proceedings. International
Conference_Location
Sinaia
Print_ISBN
0-7803-5885-6
Type
conf
DOI
10.1109/SMICND.2000.889118
Filename
889118
Link To Document