Title :
Sb-heterostructure backward diode detectors with ultrathin tunnel barriers
Author :
Zhang, Z. ; Su, Ning ; Rajavel, R. ; Deelman, P. ; Fay, P.
Author_Institution :
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
Abstract :
Sb-heterostructure backward diodes have proven to be a strong contender for millimeter-wave direct detection applications, primarily due to their high sensitivity, low noise and high frequency response. It has been shown that thinning the AlSb barrier thickness (from 32 A to 11 A) greatly reduced the junction resistance (Rj) and thus the associated Johnson noise. However this lowered the curvature coefficient. A further refinement to the heterostructure design uses Be ¿-doping in the cathode layer to improve the band alignment, which resulted in reduced noise equivalent power (NEP) and improved sensitivity. In this work, we present a study of the effects of scaling the barrier thickness to as thin as 7 A, and the improvements made by cathode ¿-doping based on the 7 A AlSb tunnel barrier structure.
Keywords :
aluminium compounds; antimony; millimetre wave detectors; millimetre wave diodes; AlSb; Johnson noise; Sb; curvature coefficient; heterostructure backward diode detectors; high frequency response; junction resistance; low noise; millimeter-wave direct detection applications; noise equivalent power; ultrathin tunnel barriers structure; Acoustical engineering; Area measurement; Bandwidth; Cathodes; Cutoff frequency; Doping; Envelope detectors; Noise reduction; Poisson equations; Semiconductor device noise;
Conference_Titel :
Device Research Conference, 2009. DRC 2009
Conference_Location :
University Park, PA
Print_ISBN :
978-1-4244-3528-9
Electronic_ISBN :
978-1-4244-3527-2
DOI :
10.1109/DRC.2009.5354958