Title :
Acoustic Emission in Power Semiconductor Modules—First Observations
Author :
Kärkkäinen, Tommi J. ; Talvitie, Joonas P. ; Kuisma, Mikko ; Hannonen, J. ; Strom, Juha-P. ; Mengotti, Elena ; Silventoinen, Pertti
Author_Institution :
Inst. of Energy Technol., Lappeenranta Univ. of Technol., Lappeenranta, Finland
Abstract :
Traditionally, condition monitoring of power semiconductor modules has been based on electrical measurements. Acoustic emission has been utilized for condition monitoring in many other applications, but is an unknown phenomenon in power semiconductor modules. In this paper, the authors present an experimental setup used to show that acoustic emission does occur because of the switching of power semiconductor components. An analysis based on propagation delays is used to determine the source of the acoustic emission.
Keywords :
acoustic emission; acoustic wave propagation; condition monitoring; power semiconductor devices; acoustic emission source; condition monitoring; electrical measurement; power semiconductor module; propagation delay analysis; Acoustic emission; Acoustic measurements; Insulated gate bipolar transistors; Semiconductor device measurement; Switches; Acoustic emission; acoustic measurements; power semiconductor switches; prognostics and health management; semiconductor device reliability;
Journal_Title :
Power Electronics, IEEE Transactions on
DOI :
10.1109/TPEL.2013.2295460