Initial experimental results of re-trapping studies on a large area diode on RITS-3

Author

Portillo, S. ; Hahn, K. ; Maenchen, J. ; Molina, I. ; Cordova, S. ; Johnson, D.L. ; Rose, D. ; Oliver, B. ; Welch, D.

Author_Institution

Sandia Nat. Labs., Albuquerque, NM, USA

Volume

2

fYear

2003

fDate

15-18 June 2003

Firstpage

879

Abstract

As part of a continuous research effort into advanced flash radiographic sources using intense electron beams, Sandia National Laboratories (SNL) has been investigating coupling vacuum power flow into various high power diodes. Of key importance is the issue of the re-trapping of electrons from the sheath current of a magnetically insulated vacuum transmission line (MITL) into the diode load. Results of electron re-trapping studies on a large area diode (LAD) on the RITS-3 accelerator are presented here. RITS- 3 is a 4.5 MV, 160 kA inductive voltage adder pulsed power accelerator. Results show that re-trapping of the sheath current does occur and compares favorably with particle-in-cell (PIC) predictions of the LSP modeling code.

Keywords

diodes; electron accelerators; electron beams; plasma simulation; pulsed power technology; radiography; transmission lines; LSP modeling code; RITS-3 accelerator; Sandia National Laboratories; coupling vacuum power flow; electron beams; flash radiographic sources; inductive voltage adder; large area diode; magnetically insulated vacuum transmission line; particle-in-cell simulation; power diodes; pulsed power accelerator; radiographic integrated test stand; sheath current; Diodes; Electron accelerators; Electron beams; Insulation; Laboratories; Load flow; Optical coupling; Particle accelerators; Power transmission lines; Radiography;

fLanguage

English

Publisher

ieee

Conference_Titel

Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International

Conference_Location

Dallas, TX, USA

Print_ISBN

0-7803-7915-2

Type

conf

DOI

10.1109/PPC.2003.1277950

Filename

1277950