• DocumentCode
    269437
  • Title

    Performances of Strained Nanowire Devices: Ballistic Versus Scattering-Limited Currents

  • Author

    Viet-Hung Nguyen ; Triozon, Francois ; Bonnet, Frédéric D. R. ; Niquet, Yann-Michel

  • Author_Institution
    INAC, SP2M, UJF-Grenoble 1, Grenoble, France
  • Volume
    60
  • Issue
    5
  • fYear
    2013
  • fDate
    May-13
  • Firstpage
    1506
  • Lastpage
    1513
  • Abstract
    We discuss the performances of (001) and (110) oriented gate-all-around silicon nanowire (Si NW) transistors within a nonequilibrium Green´s functions framework, taking surface roughness and phonon scatterings into account. We show, in agreement with previous studies, that uniaxial tensile (respectively, compressive) strains can significantly improve the mobility of electrons (respectively, holes) in the channel. This does not, however, necessarily result in a comparable enhancement of the device performances. Indeed, the current in short channels is limited by both the scattering and the number of sub-bands available for carrier transport in quantum confined systems (intrinsic “ballistic” resistance). The dependence of the mobility and ballistic resistance on strains can be different, which calls for a careful design of the devices. We show, in this respect, that (110) Si NWs provide the best opportunities for strain engineering in ultimate short channel transistors.
  • Keywords
    Green´s function methods; MOSFET; ballistic transport; electron mobility; elemental semiconductors; hole mobility; nanowires; silicon; surface roughness; Si; ballistic current; carrier transport; compressive strain; device performance; electron mobility; gate-all-around silicon nanowire transistors; hole mobility; intrinsic ballistic resistance; nonequilibrium Green´s functions framework; phonon scatterings; quantum confined systems; scattering-limited current; strain engineering; strained nanowire devices; surface roughness; ultimate short channel transistors; uniaxial tensile strain; Logic gates; Performance evaluation; Phonons; Resistance; Scattering; Silicon; Strain; Green functions; mobility; nanowire; strain; transistor;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2013.2248734
  • Filename
    6480912