DocumentCode
269437
Title
Performances of Strained Nanowire Devices: Ballistic Versus Scattering-Limited Currents
Author
Viet-Hung Nguyen ; Triozon, Francois ; Bonnet, FreÌdeÌric D. R. ; Niquet, Yann-Michel
Author_Institution
INAC, SP2M, UJF-Grenoble 1, Grenoble, France
Volume
60
Issue
5
fYear
2013
fDate
May-13
Firstpage
1506
Lastpage
1513
Abstract
We discuss the performances of (001) and (110) oriented gate-all-around silicon nanowire (Si NW) transistors within a nonequilibrium Green´s functions framework, taking surface roughness and phonon scatterings into account. We show, in agreement with previous studies, that uniaxial tensile (respectively, compressive) strains can significantly improve the mobility of electrons (respectively, holes) in the channel. This does not, however, necessarily result in a comparable enhancement of the device performances. Indeed, the current in short channels is limited by both the scattering and the number of sub-bands available for carrier transport in quantum confined systems (intrinsic “ballistic” resistance). The dependence of the mobility and ballistic resistance on strains can be different, which calls for a careful design of the devices. We show, in this respect, that (110) Si NWs provide the best opportunities for strain engineering in ultimate short channel transistors.
Keywords
Green´s function methods; MOSFET; ballistic transport; electron mobility; elemental semiconductors; hole mobility; nanowires; silicon; surface roughness; Si; ballistic current; carrier transport; compressive strain; device performance; electron mobility; gate-all-around silicon nanowire transistors; hole mobility; intrinsic ballistic resistance; nonequilibrium Green´s functions framework; phonon scatterings; quantum confined systems; scattering-limited current; strain engineering; strained nanowire devices; surface roughness; ultimate short channel transistors; uniaxial tensile strain; Logic gates; Performance evaluation; Phonons; Resistance; Scattering; Silicon; Strain; Green functions; mobility; nanowire; strain; transistor;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2013.2248734
Filename
6480912
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