Title :
Millimeter-Wave Material Properties and Measurements
fDate :
May 9 1975-June 11 1987
Abstract :
Emerging millimeter-wave (MMW) applications require reliable data on the MMW properties of materials. An overview is given of some of these requirements, the nature and limitation of the available data, the means of obtaining such data, and the progress that is being made in characterizing the MMW properties of materials.
Keywords :
Absorption; Conducting materials; Crystalline materials; Dielectric materials; Material properties; Millimeter wave measurements; Millimeter wave technology; Optical materials; Optical waveguides; Semiconductor materials;
Conference_Titel :
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location :
Palo Alto, CA, USA
DOI :
10.1109/MWSYM.1987.1132520
