DocumentCode :
2694780
Title :
Development of a terawatt test stand at the University of Missouri for fast, multichannel switching analysis
Author :
LeChien, Keith R. ; Gahl, John M. ; Kemp, Mark A. ; Curry, Randy D. ; Elizondo, Juan M. ; Struve, Kenneth W.
Author_Institution :
Dept. of Electr. Eng., Missouri Univ., Columbia, MO, USA
Volume :
2
fYear :
2003
fDate :
15-18 June 2003
Firstpage :
1051
Abstract :
The University of Missouri Terawatt Test Stand (MUTTS) began assembly in January 2003. Construction of MUTTS is progressing rapidly with the design and development of its high energy Marx bank. The Marx bank consists of 32, 100 kV, 0.7 /spl mu/F capacitors switched by 16 Physics International T508 spark gaps. The Marx is switched into two parallel 7 nF, intermediate storage capacitors, which are fired into a dummy load through a fast multi-channeling output switch. The Marx stores 100 kJ and can deliver a voltage of 2 MV at 500 kA into a 4 /spl Omega/ load delivering 1 TW to the load. Initial testing will be of a multichanneling 2 MV output switch, which scales nicely to a 6 MV switch design for future very high energy machines at Sandia National Laboratories. The output switch is to reliably multichannel, or close with many parallel arc channels. The goal is to adapt an existing multichanneling switch to create a multichanneling output switch with significant operational advantages, including lower inductance, compared to existing multichannel switches. The target switch inductance is 100 nH or less. The facility and tank were assembled from January to June 2003, with testing to begin in July 2003. Simulations of the test stand and specifications of the output switch will be presented. Electrode configurations and switch augmentations that will facilitate a reliable multi-channeling switch will be introduced. Details describing the development of the MUTTS facility will be included.
Keywords :
capacitor storage; capacitor switching; electric breakdown; 0.7 muF; 1 TW; 100 kJ; 100 kV; 2 MV; 32 kV; 500 kA; 7 nF; University of Missouri Terawatt Test Stand; electrode configurations; multichannel switching analysis; multichanneling output switch; parallel arc channels; storage capacitors; switch augmentations; terawatt test; Assembly; Capacitors; Electrodes; Inductance; Laboratories; Physics; Spark gaps; Switches; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 2003. Digest of Technical Papers. PPC-2003. 14th IEEE International
Conference_Location :
Dallas, TX, USA
Print_ISBN :
0-7803-7915-2
Type :
conf
DOI :
10.1109/PPC.2003.1277992
Filename :
1277992
Link To Document :
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