DocumentCode :
2694914
Title :
Observer based plasma glucose prediction in type I diabetes
Author :
Ståhl, F. ; Johansson, R.
Author_Institution :
Dept. Autom. Control, Lund Univ., Lund, Sweden
fYear :
2010
fDate :
8-10 Sept. 2010
Firstpage :
1620
Lastpage :
1625
Abstract :
Recent years´ progress in the development of Continuous Glucose Monitors (CGM) has made rich well-sampled glucose data readily available. Reliable, frequent measurements are of outmost importance for the emerging closed-loop control of diabetic plasma glucose. However, these sensors do not measure the variable of primary interest - plasma glucose, but a delayed signal - the interstitial glucose. To overcome this difficulty this paper presents a novel model, merging a black-box model of the glucose dynamics together with a CGM sensor model. Using an observer the plasma glucose level is estimated and predicted. The outlined scheme was evaluated on one patient, with a significant sensor delay, from a clinical trial of the DIAdvisor European FP7-project. Using the raw signal from the CGM device together with meal and insulin infusion data predictions for 20, 40 and 60 min were produced for a breakfast meal. Results: RMSE of the prediction error was smaller than 26 mg/dl for validation data even for the longest prediction horizon and no points in the C/D/E zones in the pCGA evaluation. The model clearly outperformed the CGMS and the results indicate that the method could be used successfully.
Keywords :
closed loop systems; diseases; medical control systems; observers; sensors; sugar; CGM sensor model; DIAdvisor European FP7-project; black-box model; closed-loop control; continuous glucose monitors; delayed signal; diabetic plasma glucose; glucose dynamics; insulin infusion data prediction; interstitial glucose; observer based plasma glucose prediction; plasma glucose level; sensor delay; type I diabetes; Delay; Insulin; Noise; Plasmas; Predictive models; Sensors; Sugar;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Applications (CCA), 2010 IEEE International Conference on
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-5362-7
Electronic_ISBN :
978-1-4244-5363-4
Type :
conf
DOI :
10.1109/CCA.2010.5611242
Filename :
5611242
Link To Document :
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