Title :
Integrated system development process for high-precision motion control systems
Author :
Zschäck, S. ; Amthor, A. ; Müller, M. ; Klöckner, J. ; Ament, Ch ; Fengler, W.
Author_Institution :
Syst. Anal. Group, Ilmenau Univ. of Technol., Ilmenau, Germany
Abstract :
A cost-efficient way to achieve high-accuracy motion control is the utilization of complex control algorithms. Hence advanced motion control constitutes a class of real-time applications, for which the technical feasibility strongly depends on the achievable execution performance on the embedded processing platform. The presented modular controller structure defines a set of advanced control algorithms able minimize the tracking error, even for friction affected kinematics. Transferring the controller design to an implementation-oriented modelling level focuses on minimizing the processing latency in order to realize the required high sample rate. The utilization or even the custom development of a parallel platform becomes inevitable, which is why it is necessary to integrate both, control and embedded platform development processes. The presented process includes controller design, platform mapping and architecture optimization to address the challenge of tailoring an application-specific modular embedded processing platform already on the modelling level before interfacing state-of-the-art tool chains.
Keywords :
kinematics; motion control; precision engineering; real-time systems; advanced control algorithms; application-specific modular embedded processing platform; architecture optimization; complex control algorithms; controller design; custom development; high-accuracy motion control; high-precision motion control systems; implementation-oriented modelling level; integrated system development process; kinematics; modular controller structure; parallel platform; platform mapping; real-time applications; state-of-the-art tool chains; Adaptation model; Force; Friction; Hardware; Mathematical model; Process control; Trajectory;
Conference_Titel :
Control Applications (CCA), 2010 IEEE International Conference on
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-5362-7
Electronic_ISBN :
978-1-4244-5363-4
DOI :
10.1109/CCA.2010.5611250