DocumentCode
2695042
Title
Microwave Measurements of GaAs Integrated Circuits Using Electrooptic Sampling
Author
Weingarten, K.J. ; Majidi-Ahy, R. ; Rodwell, M.J.W. ; Auld, B.A. ; Bloom, D.M.
Volume
2
fYear
1987
fDate
May 9 1975-June 11 1987
Firstpage
877
Lastpage
880
Abstract
We describe the electrooptic sampling system at Stanford with emphasis on the requirements for microwave measurements. Results presented include internal-node measurements of 20 GHz distributed amplifiers, propagation delays in GaAs frequency dividers clocked to 18 GHz, and VSWR on IC transmission lines to 40 GHz.
Keywords
Distributed amplifiers; Frequency conversion; Frequency measurement; Gallium arsenide; Integrated circuit measurements; Microwave integrated circuits; Microwave measurements; Propagation delay; Sampling methods; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1987 IEEE MTT-S International
Conference_Location
Palo Alto, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1987.1132557
Filename
1132557
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