Picosecond Reflectometry Technique for On-Chip Characterization of Millimeter-Wave Semiconductor Devices

A multi-sampler reflectometer technique k described for on-chip characterization of semiconductor devices at millimeter-wave frequencies. Focus is on enhancing measurement accuracy and frequency band coverage by augmenting photoconductive circuit elements, which perform signal generation and sampler functions, with pulse-shaping and impedance-matching networks. The approach is illustrated with a GaAs 150 GHz bandwidth example.