• DocumentCode
    2695093
  • Title

    Cofiring different dielectric constants inside LTCC for metamaterial applications

  • Author

    Gong, Xun ; Smyth, Thomas ; Chappell, William J.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Central Florida Univ., Orlando, FL
  • fYear
    2006
  • fDate
    9-14 July 2006
  • Firstpage
    1935
  • Lastpage
    1938
  • Abstract
    Dielectric materials with high dielectric constant contrast (68.7/6.37) are cofired inside low temperature cofired ceramics (LTCC) to demonstrate the capability of this processing technique for various metamaterial applications. Optical measurement shows good compatibility between the two different LTCC materials. By creating stratified-medium-loaded resonators inside electromagnetic bandgap (EBG) structures, bulk material properties of the high/low-dielectric-constant materials are characterized and verified at microwave frequencies to further prove the cofirability. This cofirability of different materials into one entity is the enabling technique for realizing artificial metamaterial substrates and vertically integrated RF front ends
  • Keywords
    ceramics; dielectric materials; dielectric resonators; metamaterials; permittivity; photonic band gap; LTCC; artificial metamaterial substrates; bulk material properties; cofiring different dielectric constants; dielectric constant contrast; dielectric materials; electromagnetic bandgap structures; low temperature cofired ceramics; metamaterial applications; microwave frequencies; optical measurement; stratified-medium-loaded resonators; vertically integrated RF front ends; Ceramics; Dielectric constant; Dielectric materials; Dielectric measurements; High-K gate dielectrics; Metamaterials; Optical materials; Optical resonators; Periodic structures; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium 2006, IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    1-4244-0123-2
  • Type

    conf

  • DOI
    10.1109/APS.2006.1710953
  • Filename
    1710953